ISBN: | 0824766652 |
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个人名称: | Bain, Lee J.1939- |
题名: | Statistical analysis of reliability and life-testing models : theory and methods / Lee J. Bain. |
出版发行项: | New York : M. Dekker, c1978. |
载体形态: | xii, 450 p. ; 24 cm. |
书目附注: | Includes bibliographical references p. (429-438) and indexes. |